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High contact reliability and load durability
This product is a fixture required for inserting and securing semiconductor devices in semiconductor testing, which demands high contact reliability and load durability without interfering with high-speed signals.
High precision. Balancing reliability with short delivery times, low prices, and ease of use. Cartridge-type test socket <T3P>.
In pursuit of improving efficiency and reducing costs in the semiconductor testing process, Yamai Electric has developed the cartridge-type probe pin test socket, known as <T3P>, using its unique technology. This product is the culmination of our expertise in "miniaturization technology" and "precision mold forming technology" cultivated in the burn-in socket field. <T3P> is a groundbreaking product that maintains high precision and reliability while keeping delivery times and prices down, and it emphasizes ease of use.
